Datasheet
数据手册 > 时钟,缓冲器,驱动器,锁相环 > ON Semiconductor > MC100LVEP111FAG 数据手册PDF > MC100LVEP111FAG 应用笔记 第 1/20 页
MC100LVEP111FAG
¥ 31.53
百芯的价格

MC100LVEP111FAG 应用笔记 - ON Semiconductor

  • 制造商:
    ON Semiconductor
  • 分类:
    时钟,缓冲器,驱动器,锁相环
  • 封装
    LQFP-32
  • 描述:
    2.5V / 3.3V 2:1:10 Differential ECL/PECL/HSTL Clock / Data Fanout Buffer, 32 LEAD LQFP 7x7, 0.8P, 250-JTRAY
  • 页面指南:
更新时间: 2024-08-08 21:54:19 (UTC+8)

MC100LVEP111FAG 应用笔记

页码:/20页
下载 PDF
重新加载
下载
Semiconductor Components Industries, LLC, 2003
November, 2003 − Rev. 1
1 Publication Order Number:
AND8090/D
AND8090/D
AC Characteristics of ECL
Devices
APPLICATION NOTE USAGE
This application note provides a general overview of the
AC characteristics that are specified on the
ON Semiconductor data sheets for MECL 10K, 10H,
100H, ECLinPS, ECLinPS Lite, and GigaComm SiGe
devices. Data sheet information takes precedence over this
application note if there are differences. This application
note includes the following information:
AC Test Bench Information
AC Characteristic Definitions
AC Characteristic Test Methods
AC Characteristic Examples
AC Characteristic Symbols
AC Characteristic References
TABLE OF CONTENTS
Lab Testing
Test Bench Overview 2. . . . . . . . . . . . . . . . . . . . . . . . . . .
Test Initialization 2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test Bench Equipment 3. . . . . . . . . . . . . . . . . . . . . . . . . .
AC Test Boards 4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal Levels
AC HIGH and LOW Levels 5. . . . . . . . . . . . . . . . . . . . . .
Oscilloscope Averaging 5. . . . . . . . . . . . . . . . . . . . . . . . .
Input Levels 5. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output Levels 5. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output Swing 6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Signal Timing
Duty Cycle 6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum Input Frequency 6. . . . . . . . . . . . . . . . . . . . . .
Differential Characteristics
Differential Input Application 7. . . . . . . . . . . . . . . . . . . . .
Unused Output Termination 7. . . . . . . . . . . . . . . . . . . . . .
Differential Crosspoint 7. . . . . . . . . . . . . . . . . . . . . . . . . .
Input Voltage Swing 7. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test Input Swing 7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Differential Characteristics (continued)
Common Mode Range 7. . . . . . . . . . . . . . . . . . . . . . . . . .
Differential Input Example 8. . . . . . . . . . . . . . . . . . . . . . .
Single−Ended Characteristics
Single−Ended Inputs 8. . . . . . . . . . . . . . . . . . . . . . . . . . .
Single−Ended 50% Points 8. . . . . . . . . . . . . . . . . . . . . . .
Single–Ended Input Voltage Range 8. . . . . . . . . . . . . . .
Single–Ended Input Test Level 8. . . . . . . . . . . . . . . . . . .
Differential Inputs (Single–Ended Mode) 9. . . . . . . . . . .
Timing Characteristics
Output Rise and Fall Times 9. . . . . . . . . . . . . . . . . . . . . .
Propagation Delay 10. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Skew (Duty Cycle) 11. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Skew (Within Device) 11. . . . . . . . . . . . . . . . . . . . . . . . . .
Skew (Device to Device) 11. . . . . . . . . . . . . . . . . . . . . . .
Minimum Input Pulse Width 11. . . . . . . . . . . . . . . . . . . . .
Setup and Hold Time 12. . . . . . . . . . . . . . . . . . . . . . . . . .
Set and Reset Recovery Time 14. . . . . . . . . . . . . . . . . .
Jitter
Jitter Overview 15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Random Jitter 15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
RJ Confidence Levels 15. . . . . . . . . . . . . . . . . . . . . . . . .
Total RJ Test Setup 16. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test Equipment RJ Test Setup 16. . . . . . . . . . . . . . . . . .
DUT RJ Calculation 16. . . . . . . . . . . . . . . . . . . . . . . . . . .
Deterministic Jitter 17. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Total DJ Test Setup 17. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Test Equipment DJ Test Setup 18. . . . . . . . . . . . . . . . . .
DUT DJ Calculation 18. . . . . . . . . . . . . . . . . . . . . . . . . . .
Symbols and Acronyms
Symbols and Acronyms Table 19. . . . . . . . . . . . . . . . . . .
References
AC Characteristic References 20. . . . . . . . . . . . . . . . . . .
APPLICATION NOTE
http://onsemi.com
页面指南

MC100LVEP111FAG 数据手册 PDF

MC100LVEP111FAG 数据手册
ON Semiconductor
13 页, 164 KB
MC100LVEP111FAG 产品设计参考
ON Semiconductor
9 页, 72 KB
MC100LVEP111FAG 其它数据手册
ON Semiconductor
37 页, 344 KB
MC100LVEP111FAG 产品设计图
ON Semiconductor
2 页, 57 KB
MC100LVEP111FAG 应用笔记
ON Semiconductor
20 页, 897 KB
MC100LVEP111FAG 产品描述及参数
ON Semiconductor
14 页, 174 KB
MC100LVEP111FAG 产品修订记录
ON Semiconductor
4 页, 152 KB
MC100LVEP111FAG 其他参考文件
ON Semiconductor
1 页, 139 KB

MC100LVEP111 数据手册 PDF

MC100LVEP111
数据手册
ON Semiconductor
2.5V / 3.3V 1:10 Differential ECL/PECL/HSTL Clock Driver
MC100LVEP111FAG
数据手册
ON Semiconductor
2.5V / 3.3V 2:1:10 Differential ECL/PECL/HSTL Clock / Data Fanout Buffer, 32 LEAD LQFP 7x7, 0.8P, 250-JTRAY
MC100LVEP111FARG
数据手册
ON Semiconductor
2.5V / 3.3V 2:1:10 Differential ECL/PECL/HSTL Clock / Data Fanout Buffer, 32 LEAD LQFP 7x7, 0.8P, 2000-REEL
MC100LVEP111MNG
数据手册
ON Semiconductor
Clock Multiplexer 10Out 2IN 1:10 32Pin QFN EP Tube
MC100LVEP111MNRG
数据手册
ON Semiconductor
Clock Multiplexer 10Out 2IN 1:10 32Pin QFN EP T/R
MC100LVEP111FA
数据手册
ON Semiconductor
Clock Multiplexer 10Out 2IN 1:10 32Pin LQFP Tray
MC100LVEP111FAR2
数据手册
ON Semiconductor
Clock Multiplexer 10Out 2IN 1:10 32Pin LQFP T/R
MC100LVEP111FAR2G
数据手册
ON Semiconductor
Clock Multiplexer 10Out 2IN 1:10 32Pin LQFP T/R
MC100LVEP111FAGOS
产品描述及参数
ON Semiconductor
IC CLK BUFFER 2:10 3GHz 32LQFP
Datasheet 搜索
搜索
百芯智造数据库涵盖1亿多个数据手册,每天更新超过5,000个PDF文件。
在线联系我们
黄经理 - 百芯智造销售经理在线,5 分钟前
您的邮箱 *
消息 *
发送