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AN-1180
APPLICATON NOTE
One Technology Way • P. O. Box 9106 • Norwood, MA 02062-9106, U.S.A. • Tel: 781.329.4700 • Fax: 781.461.3113 • www.analog.com
Optimizing Video Platforms for Automated Post-Production Self-Tests
by Witold Kaczurba
INTRODUCTION
This application note describes techniques to use for post-
production testing and debugging of video platform using
advanced video (ADV) series devices.
Advanced video systems are becoming more complex and the
video chains contain more and more links. Employing built-in,
self-tests on video evaluation systems allows a significant
increase in productivity by automated tests.
The ADV parts include features that allow finding a short, a
disconnection, or a problem in video processing, audio
processing, or data/control circuitry. Many of ADV parts
contain internal pattern generators, synchronization detection
circuitry (for video), and built-in external memory tests that
can be used to test a platform and facilitate the process of
debugging a potentially faulty platform.
To test the system, it is assumed that final video processing
circuitry contain a microprocessor unit that has a connection to
tested video parts and contains a post-production program that
can be enabled and run at least once after production.
ADV761x
(1B)
ADV7622
ADV7623
(5)
ADV7630
(3)
ADV7619
(6)
TTL
ADV7511/0
(2)
SIMPLIFIED STANDARD DETECTION BLOCK
(BASIC DETECTION OF 861-COMPLIANT INCOMING VIDEO TIMING)
HDMI PARAMETERS AND/OR STDI DETECTION BLOCKS
(DETECTION OF INCOMING VIDEO)
FREE RUN CAPABILITY
(ALLOWS INTERNALLY GENERATED VIDEO OUTPUT)
ADV784x
(1A)
ANALOG
INPUT
HDMI
ADV7341
(7)
BASIC VIDEO PATTERN GENERATOR
(ALLOWS INTERNALLY GENERATED VIDEO OUTPUT)
HDMI
HDMI
ADV8003
(4)
ADV7850
(1C)
ANALOG
INPUT
HDMI
BUILT-IN VIDEO BLOCKS ALLOWING DIAGNOSTICS:
11339-001
Figure 1. Hypothetical Video Chain Without External Memories, SPI, and I
2
C Buses
